Aehr Test receives follow-on order for wafer-level test, burn-in systems

Aehr Test Systems (AEHR) announced it has received a follow-on purchase order from its lead silicon photonics customer for production wafer-level test and burn-in of silicon photonics integrated circuits used in data center optical interconnects and emerging optical I/O architectures for AI processors. The order reflects expanding production volumes as demand accelerates for optical connectivity solutions powering next-generation AI training and inference infrastructure. The order includes: One new ultra-high-power FOX-XP wafer-level test and burn-in system with full 300mm SECS/GEM automation, and an upgrade of an existing FOX-XP system to the new ultra-high power, fully automated configuration